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The command does a series of tests on a catalogue of dark frames
and produces:
- An estimate of the electron analogue-to-ADU conversion factor;
- A map of dark current across the CCD.
The command uses the bias offset that is expected in the keyword
BIASMEAN is which is produced by the command TESTB/CCD.
Alternatively, the user can store the name of the combined created
by the command TESTB/CCD bias frame in the keyword BIASMEAN.
Rein Warmels
Mon Jan 22 15:08:15 MET 1996